SI-Traceable Analysis of Nanomaterials by X-ray Spectrometry

[1] [Anonymous], 2017, PHYS STATUS SOLIDI C, V14

[2] [Anonymous], 2 ROADM AT FUND PAR

[3] Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation [J]. ANALYTICAL CHEMISTRY, 2007, 79 (20) : 7873 - 7882

[4] A quarter-century of metrology using synchrotron radiation by PTB in Berlin [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2009, 246 (07): : 1415 - 1434

[5] Delabie A., 2012, J VAC SCI TECHNOL A, V30, P1

[6] Quantification of Variable Functional-Group Densities of Mixed-Silane Monolayers on Surfaces via a Dual-Mode Fluorescence and XPS Label [J]. ANALYTICAL CHEMISTRY, 2015, 87 (05) : 2685 - 2692

[7] Theoretical and experimental determination of L-shell decay rates, line widths, and fluorescence yields in Ge [J]. PHYSICAL REVIEW A, 2015, 92 (02)

[8] Experimental Verification of the Individual Energy Dependencies of the Partial L-Shell Photoionization Cross Sections of Pd and Mo [J]. PHYSICAL REVIEW LETTERS, 2014, 113 (16)

[9] Depth profile characterization of ultra shallow junction implants [J]. ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2010, 396 (08) : 2825 - 2832

[10] High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range [J]. METROLOGIA, 2016, 53 (01) : 7 - 17

[1] [Anonymous], 2017, PHYS STATUS SOLIDI C, V14

[2] [Anonymous], 2 ROADM AT FUND PAR

[3] Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation [J]. ANALYTICAL CHEMISTRY, 2007, 79 (20) : 7873 - 7882

[4] A quarter-century of metrology using synchrotron radiation by PTB in Berlin [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2009, 246 (07): : 1415 - 1434

[5] Delabie A., 2012, J VAC SCI TECHNOL A, V30, P1

[6] Quantification of Variable Functional-Group Densities of Mixed-Silane Monolayers on Surfaces via a Dual-Mode Fluorescence and XPS Label [J]. ANALYTICAL CHEMISTRY, 2015, 87 (05) : 2685 - 2692

[7] Theoretical and experimental determination of L-shell decay rates, line widths, and fluorescence yields in Ge [J]. PHYSICAL REVIEW A, 2015, 92 (02)

[8] Experimental Verification of the Individual Energy Dependencies of the Partial L-Shell Photoionization Cross Sections of Pd and Mo [J]. PHYSICAL REVIEW LETTERS, 2014, 113 (16)

[9] Depth profile characterization of ultra shallow junction implants [J]. ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2010, 396 (08) : 2825 - 2832

[10] High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range [J]. METROLOGIA, 2016, 53 (01) : 7 - 17