Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components

被引:5
作者
Yan, Xiao-Qing [1 ]
Liu, Zhi-Bo [1 ]
Zhang, Xiao-Liang [1 ]
Zang, Wei-Ping [2 ]
Tian, Jian-Guo [2 ]
机构
[1] Nankai Univ, Teda Appl Phys Sch, Key Lab Weak Light Nonlinear Photon, Minist Educ, Tianjin 300457, Peoples R China
[2] Nankai Univ, Sch Phys, Tianjin 300071, Peoples R China
来源
OPTICS EXPRESS | 2010年 / 18卷 / 10期
关键词
ELLIPSE ROTATION; REFRACTIVE-INDEX; GENERATION; STATE; ABSORPTION;
D O I
10.1364/OE.18.010270
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The normal elliptically polarized light Z-scan method is modified by adding a quarter-wave plate and an analyzer before the detector. The normalized transmittance formulas of modified elliptically polarized light Z-scan are obtained for media with negligible nonlinear absorption. Compared with normal linearly and elliptically polarized light Z-scan methods, an increase of sensitivity by a factor of larger than 4 is achieved for the real part of third-order susceptibility component's measurements using this modified elliptically polarized light Z-scan method. The analytical results are verified by studying the real part of independent susceptibility components of CS2 liquid. Moreover, the potential application for cross-polarized wave generation is discussed. (c) 2010 Optical Society of America
引用
收藏
页码:10270 / 10281
页数:12
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