Analysis of Different Scalar Probe Compensation Methods for an Array of Near-Field EMI Probes

被引:8
作者
Claeys, Tim [1 ]
Vandenbosch, Guy A. E. [2 ]
Pissoort, Davy [1 ]
机构
[1] Katholieke Univ Leuven, Dept Elect Engn, M Grp, B-8000 Brugge, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn Telecommun & Microwaves, B-3000 Leuven, Belgium
关键词
Probes; Noise measurement; Arrays; Calibration; Electromagnetic compatibility; Convolution; Mutual coupling; near-field scanning; probe array; probe compensation;
D O I
10.1109/TEMC.2020.3008387
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article proposes and analyzes two possible methods to compensate the raw near-field data obtained with an array of near-field probes. The first method is based on the spatial compensation procedure for a single probe and is modified toward an array of probes. The second method is to use standard spectral (plane wave) single-probe compensation. To use the latter, guidelines on how to design an array and modify the overall measurement procedure such that mutual coupling and edge effects have less influence are given. The different methods are tested in simulation and compared with the performance of compensation on a single probe. It is shown that the standard spectral single-probe compensation, in combination with proper array design, will result in an error as low as the same compensation technique used on a single probe. It is also shown that the spatial compensation improves the results in comparison with regular calibration. However, the error is not low enough to be used for postprocessing due to ill-conditioning. This article shows the path to much needed, fast, and accurate near-field measurements.
引用
收藏
页码:344 / 352
页数:9
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