The STM view of the initial stages of polycrystalline Ag film formation

被引：50
作者：
Polop, Celia
Rosiepen, Christian
Bleikamp, Sebastian
Drese, Robert
Mayer, Joachim
Dimyati, Arbi
Michely, Thomas
机构：
[1] Rhein Westfal TH Aachen, Inst Phys 1, D-52056 Aachen, Germany
[2] Rhein Westfal TH Aachen, Gemeinschaftslabor Elektronenmikroskopie, D-52056 Aachen, Germany
来源：
NEW JOURNAL OF PHYSICS | 2007年 / 9卷
关键词：
D O I：
10.1088/1367-2630/9/3/074
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The growth of Ag thin films deposited at 300 K on amorphised Si surfaces under ultra high vacuum conditions is investigated by in situ scanning tunnelling microscopy. The analysis of film morphology as a function of film thickness together with additional annealing experiments allow a quite complete picture of the film formation processes to be obtained.
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页数：19
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