Bias current effects on the magnetoresistance of a ferromagnetic-semiconductor-ferromagnetic trilayer

被引:6
作者
Kumar, S. Bala
Tan, S. G.
Jalil, M. B. A.
机构
[1] Data Storage Inst, Singapore 117608, Singapore
[2] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore
关键词
D O I
10.1063/1.2719156
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors apply a self-consistent ballistic-diffusive theoretical model to study the bias current j effect on the magnetoresistance of a ferromagnet (FM)-semiconductor (SC)-FM trilayer, with SC highly doped (n(++)). The interfacial resistance becomes a dynamic parameter and its decrease with increasing j would be responsible for the decrease of magnetoresistance (MR) with j. The underlying physics of this model is based on a self-consistent treatment between the spin drift diffusion transport of electrons in the bulk and ballistic transmission at the interfaces. This model applies qualitatively to the more common FM-nonmagnetic-FM, metal-based current-perpendicular-to-plane spin valve, which has shown experimentally observed decline of MR with j. (c) 2007 American Institute of Physics.
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页数:3
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