Electromechanical Properties of Self-Assembled Monolayers of Tetrathiafulvalene Derivatives Studied by Conducting Probe Atomic Force Microscopy

被引:20
|
作者
Ditzler, Lindsay R. [1 ]
Karunatilaka, Chandana [1 ]
Donuru, Venkat R. [2 ]
Liu, Haiying Y. [2 ]
Tivanski, Alexei V. [1 ]
机构
[1] Univ Iowa, Dept Chem, Iowa City, IA 52242 USA
[2] Michigan Technol Univ, Dept Chem, Houghton, MI 49931 USA
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2010年 / 114卷 / 10期
关键词
MOLECULE-METAL JUNCTIONS; ELECTRON-TRANSPORT; STRUCTURAL-CHARACTERIZATION; ALKANETHIOL MONOLAYERS; GOLD; RESISTANCE; AU(111); SERIES; FILMS;
D O I
10.1021/jp9073834
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electrical conduction of metal-molecule-metal junctions formed between Au-supported self-assembled monolayers (SAMs) of symmetric tetrathiafulvalene (TTF) derivatives and a Pt-coated atomic force microscope (AFM) tip has been measured Under different compression forces using conducting probe AFM. The TTFs are linked to the metal through double metal-thiol linkers oil both sides of the molecule. The TTF junctions exhibit remarkably high electrical conduction with estimated single molecule resistance of 14.7 +/- 3.4 G Omega, corresponding to the Molecular resistivity of 390 Q-cm. A single molecule resistance of I comparable length 1-decanethiol molecule is estimated to be several orders of magnitude higher with the value of 950 +/- 22 G Omega. The TTF junction resistance displayed a Unique nonlinear dependence with the compression force. The dependence is attributed to the change in the intermolecular electronic coupling between the TTF molecules.
引用
收藏
页码:4429 / 4435
页数:7
相关论文
共 50 条
  • [21] Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy
    Ichii, T
    Urabe, M
    Fukuma, T
    Kobayashi, K
    Matsushige, K
    Yamada, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5378 - 5381
  • [22] Imaging of proteins adsorbed on self-assembled monolayers by atomic force microscopy in liquid
    Umemura, K
    Hara, M
    Sasabe, H
    Knoll, W
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (7B): : L945 - L948
  • [23] Nanoscale wettability of self-assembled monolayers investigated by noncontact atomic force microscopy
    Checco, A
    Schollmeyer, H
    Daillant, J
    Guenoun, P
    Boukherroub, R
    LANGMUIR, 2006, 22 (01) : 116 - 126
  • [24] Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy
    Ichii, Takashi
    Urabe, Masashi
    Fukuma, Takeshi
    Kobayashi, Kei
    Matsushige, Kazumi
    Yamada, Hirofumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (7 B): : 5378 - 5381
  • [25] Structural characterization of self-assembled monolayers of neoglycoconjugates using atomic force microscopy
    Tromas, C
    Eaton, P
    Mimault, J
    Rojo, J
    Penadés, S
    LANGMUIR, 2005, 21 (14) : 6142 - 6144
  • [26] Scanning probe microscopy of self-assembled organic monolayers
    Jagiellonian Univ, Krakow, Poland
    Electron Technol (Warsaw), 3-4 (440-446):
  • [27] Self-assembled multilayer films based on diazoresins studied by atomic force microscopy/friction force microscopy
    Huang, L
    Luo, GB
    Zhao, XS
    Chen, JY
    Cao, WX
    JOURNAL OF APPLIED POLYMER SCIENCE, 2000, 78 (03) : 631 - 638
  • [28] A clay self-assembled on a gold surface as studied by atomic force microscopy and electrochemistry
    Hotta, Y
    Inukai, K
    Taniguchi, M
    Nakata, M
    Yamagishi, A
    LANGMUIR, 1997, 13 (25) : 6697 - 6703
  • [29] Morphological and mechanical properties of alkanethiol self-assembled monolayers investigated via bimodal atomic force microscopy
    Albonetti, Cristiano
    Casalini, Stefano
    Borgatti, Francesco
    Floreano, Luca
    Biscarini, Fabio
    CHEMICAL COMMUNICATIONS, 2011, 47 (31) : 8823 - 8825
  • [30] Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy
    Liu, HW
    Bhushan, B
    Eck, W
    Stadler, V
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (04): : 1234 - 1240