Ultra-thin ultra-smooth and low-loss silver films on a germanium wetting layer

被引:232
作者
Chen, Weiqiang [1 ]
Thoreson, Mark D.
Ishii, Satoshi
Kildishev, Alexander V.
Shalaev, Vladimir M.
机构
[1] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词
DIFFRACTION LIMIT; SURFACE ENERGY; SUPERLENS; FIELD; NANOPARTICLES; HYPERLENS; LIGHT; LENS;
D O I
10.1364/OE.18.005124
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrate a method to fabricate ultra-thin, ultra-smooth and low-loss silver (Ag) films using a very thin germanium (Ge) layer as a wetting material and a rapid post-annealing treatment. The addition of a Ge wetting layer greatly reduces the surface roughness of Ag films deposited on a glass substrate by electron-beam evaporation. The percolation threshold of Ag films and the minimal thickness of a uniformly continuous Ag film were significantly reduced using a Ge wetting layer in the fabrication. A rapid post-annealing treatment is demonstrated to reduce the loss of the ultra-thin Ag film to the ideal values allowed by the quantum size effect in smaller grains. Using the same wetting method, we have also extended our studies to ultra-smooth silver-silica lamellar composite films with ultra-thin Ag sublayers. (C) 2010 Optical Society of America
引用
收藏
页码:5124 / 5134
页数:11
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