Single step quantum well intermixing with multiple band gap control for III-V compound semiconductors

被引:9
|
作者
Djie, HS [1 ]
Mei, T [1 ]
Arokiaraj, J [1 ]
Nie, D [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
D O I
10.1063/1.1780608
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a quantum well intermixing technique based on Ar plasma induced damage on both GaAs- and InP-based materials with single-step multiple band gap creation across a substrate. A quantum well structure with multiplewidths serves as a sensitive tool to probe the damage created by Ar plasma. The analysis reveals that the surface defects were created up to a certain depth and propagated deeper into the material upon subsequent annealing. A simple and reliable way to obtain a controlled multiple band gap was achieved by using the spatial defect modulated intermixing. Eight band gap levels were realized across a single chip of quantum well laser structure with a linear relationship to the fraction of the open area under plasma exposure. This simple approach can be implemented at a postgrowth level to a wide range of material systems to achieve multiple band gaps, suitable for photonic integration. (C) 2004 American Institute of Physics.
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页码:3282 / 3285
页数:4
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