Dewetting of the Three-Phase Contact Line on Solids

被引:32
作者
Fang, Xiaohua [1 ]
Pimentel, Miguel [2 ]
Sokolov, Jonathan [3 ]
Rafailovich, Miriam [3 ]
机构
[1] Columbia Univ, Dept Earth & Environm Engn, Langmuir Ctr Colloids & Interfaces, New York, NY 10027 USA
[2] Univ Autonoma Madrid, Dept Matemat, Fac Ciencias, E-28049 Madrid, Spain
[3] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
关键词
DROP EVAPORATION; SESSILE DROP; SURFACES; CONSTANT; DYNAMICS; PATTERNS; FILMS; ANGLE;
D O I
10.1021/la101249k
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Liquid adsorption on a substrate has great applications in ink jet printing as well as micro/nano fabrication. In this letter, we focus on obtaining a better understanding of the pinning-dewetting phenomenon through solubility measurements during droplet evaporation. The physical adsorption/penetration of liquid on the substrate material is considered to he responsible for the pinning of the three-phase contact line. Once the adsorption surrounding the contact line reaches equilibrium, dewetting occurs and the droplet shrinks. The absorption kinetics of water molecules on different substrates was monitored. An analytical technique was developed to measure the threshold adsorption density of trace solvents on these substrates including different polymers, silicon, and gold.
引用
收藏
页码:7682 / 7685
页数:4
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