The ultra-small-angle x-ray scattering instrument on UNICAT at the APS

被引:0
作者
Long, GG [1 ]
Allen, AJ [1 ]
Ilavsky, J [1 ]
Jemian, PR [1 ]
Zschack, P [1 ]
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
来源
SYNCHROTRON RADIATION INSTRUMENTATION | 2000年 / 521卷
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new ultra-small-angle X-ray scattering (USAXS) instrument has been commissioned as part of the UNICAT facility on the 33-ID line at the Advanced Photon Source. The instrument offers continuously-tunable optics for anomalous USAXS, 1000 times the throughput of earlier USAXS instruments(1,2), high sensitivity and high resolution at low scattering vector, and a scattering vector range from below 0.00015 Angstrom(-1) to above 0.5 Angstrom(-1). Early results include USAXS from colloidal silica suspensions, and anomalous USAXS from rare- earth oxides in the presence of similarly-sized cavities in silicon nitride. The addition of side-reflection optics, in an optional configuration of this instrument, enables USAXS measurements of anisotropic as well as isotropic materials.
引用
收藏
页码:183 / 187
页数:5
相关论文
共 8 条
[1]   ULTRA-SMALL-ANGLE X-RAY-SCATTERING TO BRIDGE THE GAP BETWEEN VISIBLE-LIGHT SCATTERING AND STANDARD SMALL-ANGLE SCATTERING CAMERAS [J].
ALLEN, AJ ;
JEMIAN, PR ;
BLACK, DR ;
BURDETTE, HE ;
SPAL, RD ;
KRUEGER, S ;
LONG, GG .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 347 (1-3) :487-490
[2]   TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&
[3]   SMALL ANGLE X-RAY SCATTERING BY SPHERICAL PARTICLES OF POLYSTYRENE AND POLYVINYLTOLUENE [J].
BONSE, U ;
HART, M .
ZEITSCHRIFT FUR PHYSIK, 1966, 189 (02) :151-&
[4]   High-angular-resolution camera coupled with an undulator source at the European Synchrotron Radiation Facility high-brilliance beamline [J].
Diat, O ;
Bosecke, P ;
Lambard, J ;
De Moor, PPEA .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 (02) :862-866
[5]   SILICON PHOTODIODE DETECTOR FOR SMALL-ANGLE X-RAY-SCATTERING [J].
JEMIAN, PR ;
LONG, GG .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 :430-432
[6]   Construction of a two-dimensional ultra-small-angle X-ray scattering apparatus [J].
Konishi, T ;
Yamahara, E ;
Furuta, T ;
Ise, N .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 (02) :854-856
[7]   AN ITERATIVE METHOD OF SLIT-CORRECTING SMALL ANGLE X-RAY DATA [J].
LAKE, JA .
ACTA CRYSTALLOGRAPHICA, 1967, 23 :191-&
[8]   HIGH-RESOLUTION SMALL-ANGLE X-RAY-SCATTERING CAMERA FOR ANOMALOUS SCATTERING [J].
LONG, GG ;
JEMIAN, PR ;
WEERTMAN, JR ;
BLACK, DR ;
BURDETTE, HE ;
SPAL, R .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1991, 24 :30-37