共 15 条
Easy method to adjust the angle of the carbon nanotube probe of an atomic force microscope
被引:11
作者:

Chang, YC
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机构:
Acad Sinica, Inst Phys, Taipei, Taiwan Acad Sinica, Inst Phys, Taipei, Taiwan

Wang, DC
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机构: Acad Sinica, Inst Phys, Taipei, Taiwan

Chang, CS
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机构: Acad Sinica, Inst Phys, Taipei, Taiwan

Tsong, TT
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机构: Acad Sinica, Inst Phys, Taipei, Taiwan
机构:
[1] Acad Sinica, Inst Phys, Taipei, Taiwan
[2] Natl Yunlin Univ Sci & Technol, Grad Sch Engn Sci & Technol, Touliu, Taiwan
关键词:
D O I:
10.1063/1.1577388
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
A simple, practical, and reliable method has been developed to bend the carbon nanotube probe of an atomic force microscope to vertically align with the sample structure. It must first be realized that carbon nanotubes can be plastically deformed only when they are in bundle. The bundled tubes can be bent gradually and almost continuously. By scanning a patterned sample, both the bent position and angle of the attached tube probe can be adjusted. These probes also display a self-tuning character, which makes them superior than other supersharp tips for imaging structures of great depth. (C) 2003 American Institute of Physics.
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页码:3541 / 3543
页数:3
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