Frequency modulation torsional resonance mode AFM on chlorite (001)

被引：8

作者：

Yurtsever, Ayhan ^{[1
]}

Gigler, Alexander M. ^{[1
]}

Stark, Robert W. ^{[1
]}

机构：

[1] Univ Munich, Ctr NanoSci, Dept Earth & Environm Sci, Theresienstr 41, D-80333 Munich, Germany

来源：

PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY | 2008年 / 100卷

关键词：

D O I：

10.1088/1742-6596/100/5/052033

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this paper, we discuss torsional resonance mode atomic force microscopy in frequency modulation (FM-TR-AFM) under ambient conditions. Freshly cleaved chlorite (001) exhibiting brucite-like and mica-like surface areas was investigated in constant amplitude operation in order to visualize topography and frictional properties. The measurements in frequency modulation allow the characterization of dissipative effects due to changes in the lateral forces between tip and sample.

引用

收藏

页数：4

相关论文

共 19 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] Overtone atomic force microscopy studies of decagonal quasicrystal surfaces [J].

Drobek, T. ;

Stark, R. W. ;

Graeber, M. ;

Heckl, W. M. .

NEW JOURNAL OF PHYSICS, 1999, 1 :15.1-15.11

[3] Atom-resolved image of the TiO2(110) surface by noncontact atomic force microscopy [J].

Fukui, K ;

Onishi, H ;

Iwasawa, Y .

PHYSICAL REVIEW LETTERS, 1997, 79 (21) :4202-4205

[4] Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4x2) superlattice structures of alkanethiol self-assembled monolayers [J].

Fukuma, T ;

Ichii, T ;

Kobayashi, K ;

Yamada, H ;

Matsushige, K .

JOURNAL OF APPLIED PHYSICS, 2004, 95 (03) :1222-1226

[5] Damping mechanism in dynamic force microscopy [J].

Gauthier, M ;

Tsukada, M .

PHYSICAL REVIEW LETTERS, 2000, 85 (25) :5348-5351

[6] ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].

GIESSIBL, FJ .

SCIENCE, 1995, 267 (5194) :68-71

[7] Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves [J].

Gotsmann, B ;

Anczykowski, B ;

Seidel, C ;

Fuchs, H .

APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :314-319

[8] Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system [J].

Gotsmann, B ;

Fuchs, H .

PHYSICAL REVIEW LETTERS, 2001, 86 (12) :2597-2600

[9] Noncontact scanning force microscopy based on a modified tuning fork sensor [J].

Göttlich, H ;

Stark, RW ;

Pedarnig, JD ;

Heckl, WM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08) :3104-3107

[10] Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique -: art. no. 075402 [J].

Hölscher, H ;

Gotsmann, B ;

Allers, W ;

Schwarz, UD ;

Fuchs, H ;

Wiesendanger, R .

PHYSICAL REVIEW B, 2001, 64 (07)