Crystallography of faceted boundaries in SrTiO3 electronic ceramics

被引：0

作者：

Mao, Z ^{[1
]}

Knowles, KM ^{[1
]}

机构：

[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

ELECTRON MICROSCOPY AND ANALYSIS 1997 | 1997年 / 153期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Faceted boundaries in SrTiO3 electronic ceramics have been studied using transmission electron microscopy. A number of orientation relationships were observed in both SrTiO3 internal boundary layer capacitor ceramics (IBLCs) doped with either sodium or lithium as an acceptor and niobium as a donor and a SrTiO3 semiconducting ceramic doped only with niobium. Dislocation contrast appearing in such boundaries suggested that faceting was most evident in boundaries free of intergranular films.

引用

页码：519 / 522

页数：4

共 6 条

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