Capturing input switching dependency in crosstalk noise modeling

Simulations of CMOS circuits for different input switching conditions reveal that the peak crosstalk noise can differ significantly for a given circuit structure with specific technology parameters and specific signal transition times. We show that these effects can be captured by appropriate victim driver modeling and we propose a systematic method to find the equivalent resistances for different switching conditions. In 0.25 mum technology, the maximum error of our linear model with respect to HSpice simulation using the nonlinear driver model is less than 5%, and the average error is less than 2%.