Electron microscopy image enhanced

被引：813
作者：
Haider, M
Uhlemann, S
Schwan, E
Rose, H
Kabius, B
Urban, K
机构：
[1] European Mol Biol Lab, D-69012 Heidelberg, Germany
[2] Tech Univ Darmstadt, Inst Angew Phys, D-64289 Darmstadt, Germany
[3] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
来源：
NATURE | 1998年 / 392卷 / 6678期
关键词：
D O I：
10.1038/33823
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
One of the biggest obstacles in improving the resolution of the electron microscope has always been the blurring of the image caused by lens aberrations. Here we report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality.
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页码：768 / 769
页数：2
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