Electron microscopy image enhanced

被引：815

作者：

Haider, M

Uhlemann, S

Schwan, E

Rose, H

Kabius, B

Urban, K

机构：

[1] European Mol Biol Lab, D-69012 Heidelberg, Germany

[2] Tech Univ Darmstadt, Inst Angew Phys, D-64289 Darmstadt, Germany

[3] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

来源：

NATURE | 1998年 / 392卷 / 6678期

关键词：

D O I：

10.1038/33823

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

One of the biggest obstacles in improving the resolution of the electron microscope has always been the blurring of the image caused by lens aberrations. Here we report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality.

引用

页码：768 / 769

页数：2

共 10 条

[1]

BECK VD, 1979, OPTIK, V53, P241

[2]

HAIDER M, 1995, OPTIK, V99, P167

[3] IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .1. THEORY [J].