Stable Haptic Interaction for AFM-based Nanomanipulation

被引：0

作者：

Lim, Yo-An ^{[1
]}

Lee, Chang Gyu ^{[1
]}

Kim, Jong-Phil ^{[2
]}

Ryu, Jeha ^{[1
]}

机构：

[1] Gwangju Inst Sci & Technol, Dept Mechatron, Buk Gu, 1 Oryong Dong, Kwangju 500712, South Korea

[2] Korea Inst Sci & Technol, Seonbuk Gu, Seoul 136791, South Korea

来源：

ISIE: 2009 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS | 2009年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a 1-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors.

引用

页码：972 / +

页数：2

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