Co-Learning Bayesian Model Fusion: Efficient Performance Modeling of Analog and Mixed-Signal Circuits Using Side Information

被引:0
|
作者
Wang, Fa [1 ]
Zaheer, Manzil [1 ]
Li, Xin [1 ]
Plouchart, Jean-Olivier [2 ]
Valdes-Garcia, Alberto [2 ]
机构
[1] Carnegie Mellon Univ, ECE Dept, Pittsburgh, PA 15213 USA
[2] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
来源
2015 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) | 2015年
基金
美国国家科学基金会;
关键词
FINDING DETERMINISTIC SOLUTION; PARAMETRIC YIELD ESTIMATION; STATISTICAL FRAMEWORK; DESIGN; REGRESSION; EXTRACTION;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Efficient performance modeling of today's analog and mixed-signal (AMS) circuits is an important yet challenging task. In this paper, we propose a novel performance modeling algorithm that is referred to as Co-Learning Bayesian Model Fusion (CL-BMF). The key idea of CL-BMF is to take advantage of the additional information collected from simulation and/or measurement to reduce the performance modeling cost. Different from the traditional performance modeling approaches which focus on the prior information of model coefficients (i.e. the coefficient side information) only, CL-BMF takes advantage of another new form of prior knowledge: the performance side information. In particular, CL-BMF combines the coefficient side information, the performance side information and a small number of training samples through Bayesian inference based on a graphical model. Two circuit examples designed in a commercial 32nm SOI CMOS process demonstrate that CL-BMF achieves up to 5x speed-up over other state-of-the-art performance modeling techniques without surrendering any accuracy.
引用
收藏
页码:575 / 582
页数:8
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