Recent Tomographic Imaging Developments at the PSICHE Beamline

被引：16

作者：

King, A. ^{[1
]}

Guignot, N. ^{[1
]}

Deslandes, J. -P. ^{[1
]}

Pelerin, M. ^{[1
,2
]}

Joosten, I. ^{[3
]}

De Looff, D. ^{[3
]}

Li, J. ^{[4
]}

Bertrand, L. ^{[1
,4
]}

Rosenberg, E. ^{[5
]}

Dewaele, A. ^{[6
]}

Boulard, E. ^{[7
]}

Le Godec, Y. ^{[7
]}

Perrillat, J. -P. ^{[8
]}

Giovenco, E. ^{[8
]}

Morard, G. ^{[7
]}

Weitkamp, T. ^{[1
]}

Scheel, M. ^{[1
]}

Perrin, J. ^{[1
]}

Chevreau, H. ^{[1
]}

Itie, J. -P. ^{[1
]}

机构：

[1] Synchrotron SOLEIL, BP 38, Gif Sur Yvette, France

[2] PSL Univ, MINES ParisTech, CNRS, Ctr Mat,UMR 7633, BP 87, F-91003 Evry, France

[3] Cultural Heritage Agcy Netherlands RCE, Amsterdam, Netherlands

[4] Univ Paris Saclay, UVSQ, Minist Culture, IPANEMA,CNRS,USR 3461, F-91192 Gif Sur Yvette, France

[5] IFP Energies Nouvelles, Rueil Malmaison, France

[6] CEA, DAM, DIF, Arpajon, France

[7] Sorbonne Univ, CNRS, UMR 7590, IMPMC,MNHN,IRD, F-75005 Paris, France

[8] Univ Lyon 1, ENS Lyon, Lab Geol Lyon, CNRS,UMR 5276, Villeurbanne, France

来源：

INTEGRATING MATERIALS AND MANUFACTURING INNOVATION | 2019年 / 8卷 / 04期

关键词：

Tomography; Diffraction; Synchrotron radiation; Materials science; Extreme conditions; In situ;

D O I：

10.1007/s40192-019-00155-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

PSICHE is a high-energy, multi-technique beamline at the SOLEIL synchrotron facility. It performs X-ray tomography for materials science and other applications and X-ray diffraction for samples at extreme conditions. The beamline has been in service for user experiments since 2013, but is in continual development to add new capabilities. In this article, we present a series of new developments which combine diffraction and tomography and which are of relevance to the study of materials and manufacturing. By combining these techniques, we can add quantitative structural information from diffraction to morphological information obtained by tomography. Recent developments in very fast tomography allow dynamic processes to be studied in situ and in 3D with a time (frequency) resolution of 2 Hz. We have developed in situ sample environments to enable fast tomography measurements at high temperature and pressure, which will allow future studies of industrial processes such as hot isostatic pressing (HIP).

引用

页码：551 / 558

页数：8

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