Near-field microwave microscopy for the characterization of dielectric materials

被引：2
作者：
Rammal, Jamal [1 ]
Tantot, Olivier [1 ]
Delhote, Nicolas [1 ]
Verdeyme, Serge [1 ]
机构：
[1] CNRS, XLIM UMR 6172, F-87060 Limoges, France
来源：
INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES | 2014年 / 6卷 / 06期
关键词：
Characterization; Near-field; Dielectric resonator; Dielectric materials; Multi-frequency;
D O I：
10.1017/S175907871400110X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we present a near-field microwave microscopy method for the characterization of dielectric materials samples in the Industrial, Scientific and Medical (ISM) band. The system proposed is composed of a probe coupled to a dielectric resonator (DR) operating in the TE011 mode. Latter this is used to fix the resonance frequency of the resonator at 2.45 GHz. This system is used for the characterization of dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms, but a small plane surface. The same device is used for a multi-frequency characterization (4-20 GHz) using resonance frequencies of the cavity instead of one resonance frequency of the DR.
引用
收藏
页码：549 / 554
页数：6
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