XAFS, SAXS and HREM characterization of Pd nanoparticles capped with n-alkyl thiol molecules

被引:25
作者
Ramallo-Lopez, J. M.
Giovanetti, L.
Craievich, A. F.
Vicentin, F. C.
Marin-Almazo, M.
Jose-Yacaman, M.
Requejo, F. G.
机构
[1] Natl Univ La Plata, Dept Fis, FCE, RA-1900 La Plata, Argentina
[2] Consejo Nacl Invest Cient & Tecn, INIFTA, IFLP, RA-1900 La Plata, Argentina
[3] Univ Sao Paulo, Inst Phys, BR-05508900 Sao Paulo, Brazil
[4] Lab Nacl Luz Sincrotron, BR-13084971 Campinas, SP, Brazil
[5] Inst Nacl Invest Nucl, Mexico City 11801, DF, Mexico
[6] Texas Mat Inst, Ctr Nano & Mat Tech, Austin, TX USA
关键词
palladium nanoparticles; XAFS; SAXS; HRTEM;
D O I
10.1016/j.physb.2006.07.044
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We report a structural characterization of palladium nanoparticles, with an average diameter of 1.2nm, capped with three different n-alkyl thiol molecules (n = 12, 16 and 18). For this purpose several experimental techniques were used, namely X-ray absorption fine structure (XAFS), small angle X-ray scattering (SAXS) and high-resolution electron transmission microscopy (HRTEM). SAXS and HRTEM results yielded the sizes of the Pd nanoparticles in each sample. The effects of sulfur-palladium interaction on the structural and electronic properties of the studied material were derived from XAFS results. This study indicates the presence of sulfurized palladium in the bulk of the three studied capped Pd nanoparticles. Slight variations in the degree of sulfidation were detected for nanoclusters with different thiol chain lengths. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:150 / 154
页数:5
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