Full-aperture measurement of convex surfaces in interferometric test using holographic test plates

被引：6
作者：
Liu, H [1 ]
Lu, ZW
Li, FY
Xie, YJ
机构：
[1] Chinese Acad Sci, Changchun Inst Opt & Fine Mech & Phys, State Key Lab Appl Opt, Changchun 130022, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing, Peoples R China
来源：
OPTICS COMMUNICATIONS | 2004年 / 241卷 / 4-6期
基金：
中国国家自然科学基金;
关键词：
interferometer; computer-generated holograms; optical testing techniques;
D O I：
10.1016/j.optcom.2004.07.020
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We demonstrated experimentally a valid method for full-aperture measurement of large convex surfaces in the interferometric optical test using holographic test plates. The method utilizes the strategy of measuring twice with different pinhole determined by illumination system errors. We adopt this method to relax the requirements for illumination optics and computer-generated hologram of the test system when measuring large-aperture convex aspheric. We have designed and fabricated one optical test system with large errors in illumination optics and low fringe frequency in CGH, and tested a 100-mm diameter convex surface with full aperture by measuring it twice with proper pinholes. It is believed that this method can be used to relax the test system and reduce the cost significantly for even larger convex aspheric. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：231 / 236
页数：6
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