Single photoelectron trapping, storage, and detection in a field effect transistor

被引:47
作者
Kosaka, H [1 ]
Rao, DS
Robinson, HD
Bandaru, P
Makita, K
Yablonovitch, E
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] NEC Corp Ltd, Photon & Wireless Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
关键词
D O I
10.1103/PhysRevB.67.045104
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have demonstrated that a single photoelectron can be trapped, stored, and its photoelectric charge detected by a source/drain channel in a transistor. The electron trap can be photoionized and repeatedly reset for the arrival of successive individual photons. This single-photoelectron transistor, operating in the lambda = 1.3 mum telecommunication band, was demonstrated by using a window-gate double-quantum-well InGaAs/InAlAs/InP heterostructure that was designed to provide near-zero electron g factor. In general, g-factor engineering allows selection rules that would convert a photon polarization to an electron-spin polarization. Such a transistor photodetector could be useful for flagging the safe arrival of a photon in a quantum repeater. In the future, the safe arrival of a photoelectric charge would trigger the commencement of the teleportation algorithm in a quantum repeater to be used for quantum telecommunications.
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页数:5
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