A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyzer

被引：0
|
作者：
Simion, Stefan [1 ,2 ]
Marcelli, Romolo [3 ]
Sajin, Gheorghe [1 ]
Bartolucci, Giancarlo [4 ]
Craciunoiu, Florea [1 ]
机构：
[1] Natl Inst Res & Dev Microtechnol, Bucharest, Romania
[2] Mil Tech Acad, Elect & Commun Dept, Bucharest, Romania
[3] CNR, Inst Microelect & Microsyst, Microwave Microsyst Grp, Rome, Italy
[4] Univ Roma Tor Vergata, Dept Elect Engn, Rome, Italy
来源：
ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY | 2009年 / 12卷 / 03期
关键词：
Vector network analyzer; on-wafer measurement; scattering matrices; CRLH coupler;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
引用
收藏
页码：394 / 401
页数：8
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