Optimum M-step, step-stress design with K stress variables

Most of the available literature on accelerated life testing deals with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a need to use more than one accelerating or other experimental variables. Examples include a test of capacitors at higher than usual levels of temperature and voltage, and a test of circuit boards at higher than usual levels of temperature, humidity, and voltage. M-step, step-stress models are extended to include k stress variables. Optimum M-step, step-stress designs with k stress variables are found. The polynomial model is considered as a special case, and a lack of fit test is discussed. Also a goodness-of-fit test is proposed and the appropriateness of using its asymptotic chi-square distribution for small samples is shown.