InGaAsP avalanche photodetectors for non-gated 1.06 μm photon-counting receivers

被引:10
作者
Itzler, Mark A. [1 ]
Jiang, Xudong [1 ]
Ben-Michael, Rafael [1 ]
Slotnkowski, Krystyna [1 ]
机构
[1] Princeton Lightwave Inc, 2555 US Route 130 S, Cranbury, NJ 08512 USA
来源
ENABLING PHOTONICS TECHNOLOGIES FOR DEFENSE, SECURITY, AND AEROSPACE APPLICATIONS III | 2007年 / 6572卷
关键词
avalanche photodiodes; single photon detector; SPAD; InGaAsP; 1.06; micron;
D O I
10.1117/12.719471
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
For the detection of single photons at 1.06 pm, silicon-based single photon avalanche diodes (SPADs) used at shorter wavelengths have very low single photon detection efficiency (similar to 1-2%), while InP/InGaAs SPADs designed for telecommunications wavelengths near 1.5 mu m exhibit dark count rates that generally inhibit non-gated (free-running) operation. To bridge this "single photon detection gap" for wavelengths just beyond I pm, we have developed high performance, large area (80-200 pm diameter) InP-based InGaAsP quaternary absorber SPADs optimized for operation at 1.06 gin. We demonstrate dark count rates that are sufficiently low to allow for non-gated operation while achieving detection efficiencies far surpassing those found for Si SPADs. At a detection efficiency of 10%, 80 Pin diameter devices exhibit dark count rates below 1000 Hz and photon counting rates exceeding I MHz when operated at -40 degrees C.
引用
收藏
页数:10
相关论文
共 35 条
[2]  
[Anonymous], PHYS SEMICONDUCTOR D
[3]  
Ben-Michael R, 2006, IEEE LEOS ANN MTG, P783
[4]   A high-performance integrated single-photon detector for telecom wavelengths [J].
Bethune, DS ;
Risk, WP ;
Pabst, GW .
JOURNAL OF MODERN OPTICS, 2004, 51 (9-10) :1359-1368
[5]   INGAAS/INP-PHOTODIODES WITH DARK CURRENT LIMITED BY GENERATION-RECOMBINATION [J].
BUCHALI, F ;
BEHRENDT, R ;
HEYMANN, G .
ELECTRONICS LETTERS, 1991, 27 (03) :235-237
[6]   HIGH-PERFORMANCE AVALANCHE PHOTO-DIODE WITH SEPARATE ABSORPTION GRADING AND MULTIPLICATION REGIONS [J].
CAMPBELL, JC ;
DENTAI, AG ;
HOLDEN, WS ;
KASPER, BL .
ELECTRONICS LETTERS, 1983, 19 (20) :818-820
[7]   PHOTOCAPACITANCE EFFECTS OF DEEP TRAPS IN NORMAL-TYPE INP [J].
CHIAO, SH ;
ANTYPAS, GA .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (01) :466-468
[8]   Design considerations for 1.06-μm InGaAsP-InP Geiger-mode avalanche photodiodes [J].
Donnelly, Joseph P. ;
Duerr, Erik K. ;
McIntosh, K. Alex ;
Dauler, Eric A. ;
Oakley, Douglas C. ;
Groves, Steven H. ;
Vineis, Christopher J. ;
Mahoney, Leonard J. ;
Molvar, Karen M. ;
Hopman, Pablo I. ;
Jensen, Katharine Estelle ;
Smith, Gary M. ;
Verghese, Simon ;
Shaver, David C. .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2006, 42 (7-8) :797-809
[9]   OPTICAL-RESPONSE TIME OF IN0.53GA0.47AS/INP AVALANCHE PHOTO-DIODES [J].
FORREST, SR ;
KIM, OK ;
SMITH, RG .
APPLIED PHYSICS LETTERS, 1982, 41 (01) :95-98
[10]   DEEP LEVELS IN IN0.53GA0.47AS/INP HETEROSTRUCTURES [J].
FORREST, SR ;
KIM, OK .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :5738-5745