Diameter dependence of the optoelectronic properties of single walled carbon nanotubes determined by ellipsometry

被引：12
作者：
Battie, Y. [1 ]
Broch, L. [1 ]
Naciri, A. En [1 ]
Lauret, J. -S. [2 ]
Guezo, M. [3 ]
Loiseau, A. [4 ]
机构：
[1] Univ Lorraine, LCP A2MC, F-57070 Metz, France
[2] ENS Cachan, Lab Aime Cotton, CNRS UPR 3321, F-94245 Cachan, France
[3] INSA, FOTON, UMR 6082, F-35043 Rennes, France
[4] ONERA CNRS, Lab Etude Microstruct, UMR 104, F-92322 Chatillon, France
来源：
CARBON | 2015年 / 83卷
关键词：
OPTICAL-PROPERTIES; TRANSPARENT; SPECTRA; ANISOTROPY; NETWORKS; FILMS;
D O I：
10.1016/j.carbon.2014.11.021
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We report ellipsometric measurement on single walled carbon nanotube (SWCNT) films performed in a large spectral range from 0.07 to 4.97 eV. The complex dielectric functions of SWCNTs are correlated to their diameter distribution extracted from transmission electron microscopy. Here we show that the transition energies between Van Hove singularities are directly related to the strong one dimensional confinement. In the infrared spectral range, the real part of the dielectric function becomes negative. The electronic properties of SWCNTs are extracted from ellipsometry by using a Drude model. The mobility and the mean free path of charge carriers are limited by the high number of SWCNT contacts. In accordance with tight binding simulation, the conductivity and the charge carrier concentration increase with the SWCNT diameter. Finally, we demonstrate that the it-plasmon energy depends on the charge carrier concentration. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码：32 / 39
页数：8
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