High-resolution, real-time three-dimensional shape measurement

被引:65
作者
Zhang, Song [1 ]
Huang, Peisen S.
机构
[1] Harvard Univ, Dept Math, Cambridge, MA 02138 USA
[2] SUNY Stony Brook, Dept Mech Engn, Stony Brook, NY 11794 USA
基金
美国国家科学基金会; 美国国家卫生研究院;
关键词
high resolution; real time; 3-D shape measurement; metrology; phase measurement; phase-shifting; structured light; range scanning;
D O I
10.1117/1.2402128
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe a high-resolution, real-time 3-D shape measurement system based on a digital fringe projection and phase-shifting technique. It utilizes a single-chip digital light processing projector to project computer-generated fringe patterns onto the object, and a high-speed CCD camera synchronized with the projector to acquire the fringe images at a frame rate of 120 frames/s. A color CCD camera is also used to capture images for texture mapping. Based on a three-step phase-shifting technique, each frame of the 3-D shape is reconstructed using three consecutive fringe images. Therefore the 3-D data acquisition speed of the system is 40 frames/s. With this system, together with the fast three-step phase-shifting algorithm and parallel processing software we developed, high-resolution, real-time 3-D shape measurement is realized at a frame rate of up to 40 frames/s and a resolution of 532 x 500 points per frame. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页数:8
相关论文
共 21 条
[1]  
[Anonymous], 1988, P SPIE
[2]  
Daniel M., 2006, Optical Shop Testing
[3]   Fifteen-month follow-up of children at risk: Comparison of the quality of life of children removed from home and children remaining at home [J].
Davidson-Arad, B .
CHILDREN AND YOUTH SERVICES REVIEW, 2005, 27 (01) :1-20
[4]   Rainbow three-dimensional camera: New concept of high-speed three-dimensional vision systems [J].
Geng, ZJ .
OPTICAL ENGINEERING, 1996, 35 (02) :376-383
[5]  
Ghiglia D. C., 1998, 2 DIMENSIONAL PHASE
[6]  
Hall-Holt O, 2001, EIGHTH IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION, VOL II, PROCEEDINGS, P359, DOI 10.1109/ICCV.2001.937648
[7]  
Hornbeck L. J., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P381, DOI 10.1109/IEDM.1993.347329
[8]   Calibration of a three-dimensional shape measurement system [J].
Hu, QY ;
Huang, PS ;
Fu, QL ;
Chiang, FP .
OPTICAL ENGINEERING, 2003, 42 (02) :487-493
[9]  
Huang Peisen S., 2005, Proceedings of the SPIE - The International Society for Optical Engineering, V6000, p60000F, DOI 10.1117/12.631259
[10]  
Huang P. S., 2005, OPT ENG, V44