Construction of GaN/Ga2O3 p-n junction for an extremely high responsivity self-powered UV photodetector

被引:300
作者
Li, Peigang [1 ]
Shi, Haoze [1 ]
Chen, Kai [1 ]
Guo, Daoyou [1 ]
Cui, Wei [2 ,3 ]
Zhi, Yusong [2 ,3 ]
Wang, Shunli [1 ]
Wu, Zhenping [2 ,3 ]
Chen, Zhengwei [2 ,3 ]
Tang, Weihua [2 ,3 ]
机构
[1] Zhejiang Sci Tech Univ, Ctr Optoelect Mat & Devices, Dept Phys, Hangzhou 310018, Zhejiang, Peoples R China
[2] Beijing Univ Posts & Telecommun, State Key Lab Informat Photon & Opt Commun, Beijing 100876, Peoples R China
[3] Beijing Univ Posts & Telecommun, Lab Optoelect Mat & Devices, Sch Sci, Beijing 100876, Peoples R China
基金
中国国家自然科学基金;
关键词
SOLAR-BLIND PHOTODETECTOR; HIGH-DETECTIVITY; THIN-FILM; BETA-GA2O3; ULTRAVIOLET; GROWTH; FABRICATION; HETEROJUNCTION; DETECTORS; NANOWIRES;
D O I
10.1039/c7tc03746e
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A self-powered ultraviolet photodetector was constructed with GaN/Ga2O3 p-n junction by depositing n-type Ga2O3 thin film on Al2O3 single crystals substrate covered by p-type GaN thin film. The fabricated device exhibits a typical rectification behavior in dark and excellent photovoltaic characteristics under 365 nm and 254 nm light illumination. The device shows an extremely high responsivity of 54.43 mA W-1, a fast decay time of 0.08 s, a high I-light/I-dark ratio of 152 and a high detectivity of 1.23 x 10(11) cm Hz(1/2) W-1 under 365 nm light with a light intensity of 1.7 mW cm(-2) under zero bias. Such excellent performances under zero bias are attributed to the rapid separation of photogenerated electron-hole pairs driven by built-in electric field in the interface depletion region of GaN/Ga2O3 p-n junction. The results strongly suggest that the GaN/Ga2O3 p-n junction based photodetectors are suitable for applications in secure ultraviolet communication and space detection which require high responsivity and self-sufficient functionality.
引用
收藏
页码:10562 / 10570
页数:9
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