Oxide-free vertical-cavity surface-emitting lasers with low junction temperature and high drive level

被引：9

作者：

Yang, X. ^{[1
]}

Li, M. ^{[1
]}

Zhao, G. ^{[2
]}

Zhang, Y. ^{[1
]}

Freisem, S. ^{[1
,2
]}

Deppe, D. G. ^{[1
,2
]}

机构：

[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA

[2] SdPhoton LLC, Oviedo, FL 32765 USA

来源：

ELECTRONICS LETTERS | 2014年 / 50卷 / 20期

关键词：

VCSELS;

D O I：

10.1049/el.2014.2626

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Data are presented showing that lithographic vertical-cavity surface-emitting lasers (VCSELs) produce minimal junction temperature rise compared to oxide VCSELs. Eliminating the thermal block caused by internal oxides combined with improved mirror materials reduces the junction temperature. The elimination of internal oxide, lower junction temperature and reduced internal strain promise increased reliability in the new VCSELs. Power conversion efficiencies in excess of similar to 50% are reported, even for very small lithographic VCSELs.

引用

页码：1474 / +

页数：2

共 8 条

[1]

Dafinca A., 2013, P SPIE INT SOC OPT E, V8639

[2] Lithographic lasers with low thermal resistance [J].

Demir, A. ;

Zhao, G. ;

Deppe, D. G. .

ELECTRONICS LETTERS, 2010, 46 (16) :1147-1148

[3]

Grabherr Martin, 2010, P SPIE INT SOC OPT E, V7615

[4]

Guenter J. K., 2011, P SPIE INT SOC OPT E, V7952

[5]

Guenter J. K., 2013, P SPIE INT SOC OPT E, V8639

[6] Reliability of proton-implanted VCSELs for data communications [J].

Guenter, JK ;

Hawthorne, RA ;

Granville, DN ;

HibbsBrenner, MK ;

Morgan, RA .

FABRICATION, TESTING, AND RELIABILITY OF SEMICONDUCTOR LASERS, 1996, 2683 :102-113

[7] Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies [J].

Herrick, RW ;

Lim, SF ;

Deng, H ;

Deng, Q ;

Dudley, JJ ;

Keever, MR ;

Oh, T ;

Li, M ;

Tashima, M ;

Hodge, LA ;

Zhang, X ;

Herniman, J ;

Evans, P ;

Liang, B ;

Lei, C .

VERTICAL-CAVITY SURFACE-EMITTING LASERS IV, 2000, 3946 :14-19

[8]

Zhao G., 2013, CLEO SCI INNOVATIONS

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