Transit-time considerations in metal-semiconductor-metal photodiode under high illumination conditions

被引:18
作者
Averine, SV
Sachot, R
机构
[1] Russian Acad Sci, Inst Radio Engn & Elect, Moscow 103907, Russia
[2] Swiss Fed Inst Technol, Inst Micro & Optoelect, CH-1015 Lausanne, Switzerland
关键词
photodetectors; MSM-photodiodes; impulse response; semiconductor device modeling;
D O I
10.1016/S0038-1101(00)00095-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A two-dimensional self-consistent time-dependent simulation technique has been used to investigate electron-hole transport processes in the active region of metal semiconductor metal photodiode structures (MSM-PD) and to analyze their high-speed response at different energy levels of the optical illumination. Charge accumulation and screening of the dark electric field at high optical excitation levels greatly modify the drift conditions of the photogenerated electrons and holes in the active region of the MSM-PD. This effect gives rise to impulse response distortion and reduced bandwidth and efficiency. Some ways of improving the high-speed response of the MSM-PD are analyzed and discussed. The conditions under which screening of the internal held has no effect on the MSM-PD response are formulated. It is shown that large active area MSM-PDs have considerable advantages over smaller area devices in their ability to detect high energy levels of optical radiation without saturation and distortions. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1627 / 1634
页数:8
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