Conduction band discontinuity and electron confinement at the SixGe1-x/Ge interface

被引:5
|
作者
Mazzeo, G. [1 ]
Yablonovitch, E. [3 ]
Jiang, H. W. [2 ]
Bai, Y. [4 ]
Fitzgerald, E. A. [4 ]
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] Univ Calif Los Angeles, Dept Phys & Astron, Los Angeles, CA 90095 USA
[3] Univ Calif Berkeley, Dept Elect Engn, Berkeley, CA 94720 USA
[4] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
关键词
conduction bands; Ge-Si alloys; g-factor; semiconductor heterojunctions;
D O I
10.1063/1.3432066
中图分类号
O59 [应用物理学];
学科分类号
摘要
Germanium rich heterostructures can constitute a valid alternative to Silicon for the confinement of single electron spins. The conduction band discontinuity in SiGe/Ge heterostructures grown on pure germanium substrate is predicted to allow the confinement of electrons in the germanium, and the conduction band profile of germanium rich heterostructures allow the implementation of g-factor modulation devices not possible in Silicon. We here prove that electrons can indeed be trapped at the Si0.1Ge0.9/Ge interface and we measure the height of the energy barrier to 0.55 +/- 0.05 eV by measuring the tunneling time of electrons as a function of the electric field. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3432066]
引用
收藏
页数:3
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