Intelligent fault diagnosis of machinery using digital twin-assisted deep transfer learning

被引:236
|
作者
Xia, Min [1 ]
Shao, Haidong [2 ]
Williams, Darren [3 ]
Lu, Siliang [4 ]
Shu, Lei [5 ]
de Silva, Clarence W. [6 ]
机构
[1] Univ Lancaster, Dept Engn, Lancaster LA1 4YW, England
[2] Hunan Univ, Coll Mech & Vehicle Engn, State Key Lab Adv Design & Mfg Vehicle Body, Changsha 410082, Peoples R China
[3] Welding Inst, Cambridge CB21 6AL, England
[4] Anhui Univ, Coll Elect Engn & Automat, Hefei 230601, Peoples R China
[5] Nanjing Agr Univ, Coll Engn, Nanjing 210095, Peoples R China
[6] Univ British Columbia, Dept Mech Engn, Vancouver, BC V6T 1Z4, Canada
基金
欧盟地平线“2020”; 中国国家自然科学基金;
关键词
Digital twin; Fault diagnosis; Novel sparse de-noising auto-encoder; Deep transfer learning;
D O I
10.1016/j.ress.2021.107938
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Digital twin (DT) is emerging as a key technology for smart manufacturing. The high fidelity DT model of the physical assets can produce system performance data that is close to reality, which provides remarkable opportunities for machine fault diagnosis when the measured fault condition data are insufficient. This paper presents an intelligent fault diagnosis framework for machinery based on DT and deep transfer learning. First, the DT model of the machine is built by establishing the simulation model and with further updating through continuously measured data from the physical asset. Second, all important machine conditions can be simulated from the built DT. Third, a new-type deep structure based on novel sparse de-noising auto-encoder (NSDAE) is developed and pre-trained with condition data from the source domain, as generated from the DT. Then, to achieve accurate machine fault diagnosis with possible variations in working conditions and system characteristics, the pre-trained NSDAE is fine-tuned using parameter transfer with only one sample from the target domain. The presented method is validated through a case study of triplex pump fault diagnosis. The experimental results demonstrate that the proposed method achieves intelligent fault diagnosis with a limited amount of measured data and outperforms other state-of-the-art data-driven methods.
引用
收藏
页数:9
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