Study of intrinsic defect states of FeSe with scanning tunneling microscopy

被引:10
作者
Bu, Kunliang [1 ]
Wang, Bo [2 ]
Zhang, Wenhao [1 ]
Fei, Ying [1 ]
Zheng, Yuan [1 ]
Ai, Fangzhou [1 ]
Wu, Zongxiu [1 ]
Wang, Qisi [3 ,4 ]
Wo, Hongliang [3 ,4 ]
Zhao, Jun [3 ,4 ,5 ]
Jin, Chuanhong [2 ]
Yin, Yi [1 ,5 ]
机构
[1] Zhejiang Univ, Zhejiang Prov Key Lab Quantum Technol & Device, Dept Phys, Hangzhou 310027, Zhejiang, Peoples R China
[2] Zhejiang Univ, Sch Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
[3] Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
[4] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
[5] Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
HIGH-TEMPERATURE SUPERCONDUCTIVITY; PHASE;
D O I
10.1103/PhysRevB.100.155127
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We apply high-resolution scanning tunneling microscopy to study intrinsic defect states of bulk FeSe. Four types of intrinsic defects, including the type-I dumbbell, type-II dumbbell, top-layer Se vacancy, and inner-layer Se-site defect, are extensively analyzed by scanning tunneling spectroscopy. Through characterized depression and enhancement of density of states measured in a large energy range, the type-I dumbbell and type-II dumbbell are determined to be the Fe vacancy and Se-Fe defect, respectively. The top-layer Se vacancy and possible inner-layer Se-site vacancy are also determined by spectroscopy analysis. The determination of defects is compared and largely confirmed in the annular dark-field scanning transmission electron microscopy measurement of the exfoliated FeSe. The detailed mapping of the defect states in our experiment lays a foundation for its comparison with the result of complex theoretical calculations in the future.
引用
收藏
页数:8
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