Computer study of the B-Si exchange in the Si(111)√3x√3-B surface phase

被引:0
作者
Zavodinsky, VG [1 ]
Chukurov, EN [1 ]
Kuyanov, IA [1 ]
机构
[1] Russian Acad Sci, Far Eastern Branch, Inst Automat & Control Proc, Vladivostok 690041, Russia
来源
PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 1998年 / 3-4卷
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O59 [应用物理学];
学科分类号
摘要
The B-H-3-B-S-5 transfer in the B/Si(111)-(root 3 x root 3) surface phase has been studied using the semi-empirical AM1 method. It has been found that the transfer has two parts. In the first part the B atom transfers from the T-4 adatom position to one of the bridge surface positions situated between a pair of the surface silicon atoms. This bridge state is 0.2 eV higher than the T-4 adatom state, and the barrier height between them is 0.6 eV. The second part of the transfer consists of the boron penetrating into the silicon second layer (S-5 position) and, simultaneously, of a silicon forcing out from the S-5 position to the T-4 adatom position. The height of this second barrier is about 0.5 eV and the energy of the final B-S-5 state is lower than the initial B-H-3 state by 1.1 eV. The total barrier height of the B-H-3-B-S-5 transfer is predicted to be about 0.7 eV.
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页码:183 / 190
页数:8
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