Analysis and improvement of accuracy, sensitivity, and resolution of the coherent gradient sensing method

被引:8
作者
Dong, Xuelin [1 ]
Zhang, Changxing [2 ]
Feng, Xue [2 ]
Duan, Zhiyin [3 ]
机构
[1] China Univ Petr, Key Lab Petr Engn, Minist Educ, Beijing 102249, Peoples R China
[2] Tsinghua Univ, AML, Dept Engn Mech, Beijing 100084, Peoples R China
[3] Beijing Univ Civil Engn & Architecture, Beijing 100044, Peoples R China
基金
中国国家自然科学基金;
关键词
FILM-SUBSTRATE SYSTEMS; THIN-FILM; STRESS; DEFORMATION; INSTABILITY; CURVATURES;
D O I
10.1364/AO.55.004752
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The coherent gradient sensing (CGS) method, one kind of shear interferometry sensitive to surface slope, has been applied to full-field curvature measuring for decades. However, its accuracy, sensitivity, and resolution have not been studied clearly. In this paper, we analyze the accuracy, sensitivity, and resolution for the CGS method based on the derivation of its working principle. The results show that the sensitivity is related to the grating pitch and distance, and the accuracy and resolution are determined by the wavelength of the laser beam and the diameter of the reflected beam. The sensitivity is proportional to the ratio of grating distance to its pitch, while the accuracy will decline as this ratio increases. In addition, we demonstrate that using phase gratings as the shearing element can improve the interferogram and enhance accuracy, sensitivity, and resolution. The curvature of a spherical reflector is measured by CGS with Ronchi gratings and phase gratings under different experimental parameters to illustrate this analysis. All of the results are quite helpful for CGS applications. (C) 2016 Optical Society of America
引用
收藏
页码:4752 / 4758
页数:7
相关论文
共 18 条
[1]  
[Anonymous], P SPIE
[2]   A comparison of X-ray microdiffraction and coherent gradient sensing in measuring discontinuous curvatures in thin film: Substrate systems [J].
Brown, Michall A. ;
Park, Tae-Soon ;
Rosakis, Ares ;
Ustundag, Ersan ;
Huang, Young ;
Tamura, Nobumichi ;
Valek, Bryan .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 2006, 73 (05) :723-729
[3]   Coherent gradient sensing microscopy (micro-CGS): A microscale curvature detection technique [J].
Budyansky, Maxim ;
Madormo, Christopher ;
Maciaszek, Jamie L. ;
Lykotrafitis, George .
OPTICS AND LASERS IN ENGINEERING, 2011, 49 (07) :874-879
[4]   Full-field Measurement of Topography and Curvature by Coherent Gradient Sensing Method at High Temperature [J].
Dong, X. ;
Zhang, C. ;
Feng, X. ;
Hwang, K. -C. .
EXPERIMENTAL MECHANICS, 2013, 53 (06) :959-963
[5]   Full-field measurement of nonuniform stresses of thin films at high temperature [J].
Dong, Xuelin ;
Feng, Xue ;
Hwang, Keh-Chih ;
Ma, Shaopeng ;
Ma, Qinwei .
OPTICS EXPRESS, 2011, 19 (14) :13201-13208
[6]   Large deformation and geometric instability of substrates with thin-film deposits [J].
Finot, M ;
Blech, IA ;
Suresh, S ;
Fujimoto, H .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (08) :3457-3464
[7]   Measuring Ge segregation by real-time stress monitoring during Si1-xGex molecular beam epitaxy [J].
Floro, JA ;
Chason, E .
APPLIED PHYSICS LETTERS, 1996, 69 (25) :3830-3832
[8]  
Freund L., 2003, THIN FILM MAT STRESS, DOI 10.1017/CBO9780511754715
[9]   Mixed-mode dynamic crack growth in functionally graded glass-filled epoxy [J].
Kirugulige, MS ;
Tippur, HV .
EXPERIMENTAL MECHANICS, 2006, 46 (02) :269-281
[10]   Full-field optical measurement of curvatures in ultra-thin-film-substrate systems in the range of geometrically nonlinear deformations [J].
Lee, H ;
Rosakis, AJ ;
Freund, LB .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (11) :6116-6129