Ultra-low-angle boundary networks within recrystallizing grains

被引：34

作者：

Ahl, S. R. ^{[1
]}

Simons, H. ^{[1
]}

Zhang, Y. B. ^{[2
]}

Detlefs, C. ^{[3
]}

Stohr, F. ^{[4
]}

Jakobsen, A. C. ^{[1
]}

Jensen, D. Juul ^{[2
]}

Poulsen, H. F. ^{[1
]}

机构：

[1] Tech Univ Denmark, Dept Phys, DK-2800 Lyngby, Denmark

[2] Tech Univ Denmark, Dept Wind Energy, DK-4000 Roskilde, Denmark

[3] European Synchrotron Radiat Facil, CS 40220, F-38043 Grenoble 9, France

[4] Tech Univ Denmark, Dill Danchip, DK-2800 Lyngby, Denmark

来源：

SCRIPTA MATERIALIA | 2017年 / 139卷

关键词：

Aluminium; Recrystallization; Recovery; X-ray diffraction (XRD); Dark field X-ray microscopy (DFXRM); DEFORMED METALS; BULK GRAINS; MICROSTRUCTURE; PROTRUSIONS; STRENGTH; GROWTH;

D O I：

10.1016/j.scriptamat.2017.06.016

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We present direct evidence of a network of well-defined ultra-low-angle boundaries in bulk recrystallizing grains of 99.5% pure aluminium (AA1050) by means of a new, three-dimensional X-ray mapping technique; dark-field X-ray microscopy. These boundaries separate lattice orientation differences on the order of 0.05 degrees and thus subdivide the recrystallizing grain into 2-7 mu m wide domains. During further annealing the orientation differences decrease and the overall structure become more uniform while the network remains. It is observed that the morphology of the grain boundaries surrounding the recrystallizing grains relate to the intragranular network and effects hereof on the boundary migration is discussed. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：87 / 91

页数：5

共 18 条

[1]

[Anonymous], 2001, ELEMENTS MODERN XRAY

[2] Deformed metals - structure, recrystallisation and strength [J].