Establishing Traceability to the International System of Units for Scattering Parameter Measurements From 750 GHz to 1.1 THz

被引：23
|
作者：
Ridler, Nick M. [1 ]
Clarke, Roland G. [2 ]
机构：
[1] Natl Phys Lab, Time Quantum & Electromagnet Div, Teddington TW11 0LW, Middx, England
[2] Univ Leeds, Sch Elect & Elect Engn, Inst Microwaves & Photon, Leeds LS2 9JT, W Yorkshire, England
来源：
IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | 2016年 / 6卷 / 01期
关键词：
Calibration and measurement; measurement traceability; submillimeter-waves; terahertz; vector network analysis (VNA); waveguides; UNCERTAINTY;
D O I：
10.1109/TTHZ.2015.2502068
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we describe a new measurement capability which provides fully calibrated, traceable scattering parameter measurements in rectangular metallic waveguide in the frequency range 750 GHz-1.1 THz. The instrumentation consists of a vector network analyzer (VNA) with waveguide extender heads, situated at the University of Leeds, Leeds, U.K., and primary measurement standards characterized by the National Physical Laboratory, Teddington, U.K.. The measurement standards consist of lengths of precision waveguide that are used during the calibration of the instrumentation. Traceability to the International System of Units (SI) is established by performing high-precision dimensional measurements on the waveguide sections. A preliminary uncertainty budget is presented, indicating the expected sizes of the main sources of error in both reflection and transmission measurements.
引用
收藏
页码：2 / 11
页数：10
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