Computational and experimental development of 2D anisotropic photonic crystal metamaterials

被引：0

作者：

Ethridge, James A. ^{[1
]}

Marciniak, Michael A. ^{[1
]}

Sarangan, Andrew M. ^{[2
]}

机构：

[1] Air Force Inst Technol, 2950 Hobson Way, Wright Patterson AFB, OH USA

[2] Univ Dayton, 300 Coll Pk, Dayton, OH USA

来源：

NANOENGINEERING: FABRICATION, PROPERTIES, OPTICS, THIN FILMS, AND DEVICES XVI | 2019年 / 11089卷

关键词：

metamaterial; photonic crystal; photonic bandgap; anistropic; COMSOL; nanorod; glancing angle deposition; ellipsometry; GLANCING ANGLE DEPOSITION; GENERALIZED ELLIPSOMETRY; BAND-GAPS;

D O I：

10.1117/12.2529654

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The future of optical devices involves manipulation of nanoscale structure. Thus, novel samples that incorporate both photonic crystal (PC) structure and metamaterial properties, known as PC metamaterials, are proposed. First, metamaterials with no PC structure are fabricated as nanorod or nanohelical structures and characterized to extract their optical constants. Then, a computational model for the metamaterial within a PC structure was developed to calculate the photonic bandgap (PBG). These results show that a large PBG with the desired directionality can be achieved with these PC metamaterials.

引用

页数：14

共 33 条

[21] Advanced techniques for glancing angle deposition [J].

Robbie, K ;

Sit, JC ;

Brett, MJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (03) :1115-1122

[22] Sculptured thin films and glancing angle deposition: Growth mechanics and applications [J].

Robbie, K ;

Brett, MJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1997, 15 (03) :1460-1465

[23] Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films [J].

Schmidt, D. ;

Booso, B. ;

Hofmann, T. ;

Schubert, E. ;

Sarangan, A. ;

Schubert, M. .

OPTICS LETTERS, 2009, 34 (07) :992-994

[24] Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry [J].

Schmidt, Daniel ;

Booso, Benjamin ;

Hofmann, Tino ;

Schubert, Eva ;

Sarangan, Andrew ;

Schubert, Mathias .

APPLIED PHYSICS LETTERS, 2009, 94 (01)

[25] Generalized ellipsometry and complex optical systems [J].

Schubert, M .

THIN SOLID FILMS, 1998, 313 :323-332

[26] Extension of rotating-analyzer ellipsometry to generalized ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2 [J].

Schubert, M ;

Rheinlander, B ;

Woollam, JA ;

Johs, B ;

Herzinger, CM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (04) :875-883

[27] Plane-wave expansion method for calculating band structure of photonic crystal slabs with perfectly matched layers [J].

Shi, SY ;

Chen, CH ;

Prather, DW .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2004, 21 (09) :1769-1775

[28]

Silva A, 2014, SCIENCE, V343, P160, DOI [10.1126/science.1242818, 10.1126/science.124405]

[29] Reconfigurable Terahertz Metamaterials [J].

Tao, Hu ;

Strikwerda, A. C. ;

Fan, K. ;

Padilla, W. J. ;

Zhang, X. ;

Averitt, R. D. .

PHYSICAL REVIEW LETTERS, 2009, 103 (14)

[30]

Wollam J. A., 1994, GUIDE USING WVASE SP

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