Energetic cluster irradiation of InP

被引:16
作者
Dhamodaran, S.
Pathak, A. P.
Dunlop, A.
Jaskierowicz, G.
Della Negra, S.
机构
[1] Univ Hyderabad, Sch Phys, Cent Univ, Hyderabad 500046, Andhra Pradesh, India
[2] Ecole Polytech, CEA, Solides Irradies Lab, F-91128 Palaiseau, France
[3] CNRS, Inst Nucl Phys, IN2P3, F-91406 Orsay, France
关键词
cluster ions; nano-track; semiconductors; TEM; thermal spike model;
D O I
10.1016/j.nimb.2006.12.009
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The track formation in semiconductors has been studied for over last ten years. The threshold electronic energy loss required to create tracks in semiconductors is relatively larger than in insulators. Among semiconductors, track formation in InP by monoatomic ion irradiation has been studied extensively. This work presents new results concerning the creation of tracks in a semiconductor, InP, irradiated at room temperature with energetic heavy cluster ions. Samples prepared for transmission electron microscopy (TEM) observations were irradiated with 23-40 MeV C-60 ions at fluences of the order of 10(10) ions cm(-2). During the slowing-down of such projectiles in the targets, energy is mainly lost in electronic excitation and ionisation. It should be noted that the corresponding energy densities are one order of magnitude higher than those obtained using GeV monoatomic ions as projectiles, which leads to very strong structural modifications. Track diameters have been measured for three different ion energies and compared to previous results obtained with monoatomic ions. We also analyse our results using thermal spike model (TSM) proposed by Szenes for track formation and address its validity for such studies. The analysis highlights the doubt on the basic assumptions of the model and its applicability particularly for the case of cluster irradiations. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:229 / 232
页数:4
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