A 2MHz BW Buffer-Embedded Noise-Shaping SAR ADC Achieving 73.8dB SNDR and 87.3dB SEDR

被引:18
作者
Kim, Taewoong [1 ]
Chae, Youngcheol [1 ]
机构
[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul, South Korea
来源
2019 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC) | 2019年
关键词
Buffer-embedded; noise-shaping; SAR ADC; input buffer; passive noise-shaping; data weighted averaging (DWA); mismatch error shaping (MES); DB SNDR; SFDR;
D O I
10.1109/CICC.2019.8780230
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a buffer-embedded noise-shaping SAR ADC, which separates the capacitive DAC (CDAC) and the sampling capacitor (C S ) placed at the input and output of input buffer. This compensates the nonlinearity of the input buffer and enables C S value to be reduced, thus leading to significant power saving. An energy efficient 2 nd -order noise-shaping is realized using passive integrators with the C S and the mismatch of CDAC is mitigated by error shaping techniques. Implemented in a 65 nm CMOS process, the ADC achieved 73.8 dB SNDR, 77 dB DR, and 87.3 dB SFDR in a 2 MHz bandwidth without any calibration. It consumes only 2.13 mW including the input buffer.
引用
收藏
页数:4
相关论文
共 7 条
[1]   A 480 mW 2.6 GS/s 10b Time-Interleaved ADC With 48.5 dB SNDR up to Nyquist in 65 nm CMOS [J].
Doris, Kostas ;
Janssen, Erwin ;
Nani, Claudio ;
Zanikopoulos, Athon ;
van der Weide, Gerard .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2011, 46 (12) :2821-2833
[2]  
Guo WJ, 2017, SYMP VLSI CIRCUITS, pC236, DOI 10.23919/VLSIC.2017.8008492
[3]   A 10b/12b 40 kS/s SAR ADC With Data-Driven Noise Reduction Achieving up to 10.1b ENOB at 2.2 fJ/Conversion-Step [J].
Harpe, Pieter ;
Cantatore, Eugenio ;
van Roermund, Arthur .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (12) :3011-3018
[4]   A 14b 80 MS/s SAR ADC With 73.6 dB SNDR in 65 nm CMOS [J].
Kapusta, Ron ;
Shen, Junhua ;
Decker, Steven ;
Li, Hongxing ;
Ibaragi, Eitake ;
Zhu, Haiyang .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (12) :3059-3066
[5]   A 14 b 35 MS/s SAR ADC Achieving 75 dB SNDR and 99 dB SFDR With Loop-Embedded Input Buffer in 40 nm CMOS [J].
Kramer, Martin J. ;
Janssen, Erwin ;
Doris, Kostas ;
Murmann, Boris .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2015, 50 (12) :2891-2900
[6]  
Liu CC, 2017, ISSCC DIG TECH PAP I, P466, DOI 10.1109/ISSCC.2017.7870463
[7]   An Oversampling SAR ADC With DAC Mismatch Error Shaping Achieving 105 dB SFDR and 101 dB SNDR Over 1 kHz BW in 55 nm CMOS [J].
Shu, Yun-Shiang ;
Kuo, Liang-Ting ;
Lo, Tien-Yu .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2016, 51 (12) :2928-2940