Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm

被引:19
作者
Liu, Guanghui [1 ]
Zhou, Ming [1 ]
Hu, Guohang [1 ]
Liu, Xiaofeng [1 ]
Jin, Yunxia [1 ]
He, Hongbo [1 ]
Fan, Zhengxiu [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Lasers, Shanghai 201800, Peoples R China
关键词
LaF3/MgF2 high reflectors; Temperature fields; Film-substrate interface; LIDT; Layer-pair number; Damage depth; Damage mechanism; MULTILAYER COATINGS; OPTICAL-PROPERTIES; THIN-FILMS; ABSORPTION; 193NM;
D O I
10.1016/j.apsusc.2010.02.003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Laser induced damage thresholds (LIDT) of LaF3/MgF2 high reflectors at 355 nm were measured and investigated as a function of layer-pair number. Generally, LaF3/MgF2 coatings with more layer pairs possessed higher LIDT, but coatings with too high layer-pair number crazed because of high tensile stress, so the LIDT of them decreased badly. The temperature rise in the coatings was calculated based on a film-substrate interfacial absorption model, and the depth of the damage in the coatings were measured by a Veeco optical profilograph. The two characterization methods together were used to interpret the effects of layer-pair number on LIDT, and the damage mechanism of coatings at laser wavelength of 355 nm was also discussed. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:4206 / 4210
页数:5
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