Optimal Test Points Selection Based on Multi-objective Genetic Algorithm

被引：0

作者：

Zhang, Yong ^{[1
]}

Chen, Xixiang ^{[1
]}

Liu, Guanjun ^{[1
]}

Qiu, Jing ^{[1
]}

Yang, Shuming ^{[1
]}

机构：

[1] Natl Univ Def Technol, Coll Mechatron Engn & Automat, Changsha 410073, Hunan, Peoples R China

来源：

IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS | 2009年

关键词：

Test points selection; system testing; design for testability; multi-objective genetic algorithm; FAULT DICTIONARY; ANALOG;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new approach to select an optimal set of test points is proposed. The described method uses fault-wise table and multi-objective genetic algorithm to find the optimal set of test points. First, the fault-wise table is constructed whose entries are measurements associated with faults and test points. The problem of optimal test points selection is transformed to the selection of the columns that isolate the rows of the table. Then, four objectives are described according to practical test requirements. The multi-objective genetic algorithm is explained. Finally, the presented approach is illustrated by a practical example. The results indicate that the proposed method efficiently and accurately rinds the optimal set of test points and is practical for large scale systems.

引用

页码：313 / 316

页数：4

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