Noncollinear Maker's fringe measurements of second-order nonlinear optical layers

被引：16
|
作者：
Faccio, D [1 ]
Pruneri, V [1 ]
Kazansky, PG [1 ]
机构：
[1] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England
来源：
OPTICS LETTERS | 2000年 / 25卷 / 18期
关键词：
D O I：
10.1364/OL.25.001376
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A novel technique for characterizing thin-film second-order nonlinearities with submicrometer resolution for the film's depth is proposed. This method is substantially a variation of the classic one-beam Maker's fringe technique and uses the second harmonic generated by two noncollinear fundamental beams. Compared with that for the one-beam case, this configuration reduces the coherence length of the process, thus increasing the resolution for the nonlinear depth measurements. The technique has been implemented on thermally poled silica samples, revealing the initial growth of the nonlinear region. (C) 2000 Optical Society of America.
引用
收藏
页码：1376 / 1378
页数：3
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