Scanning nanolithography using a material-filled nanopipette
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作者:
Hong, MH
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机构:Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Hong, MH
Kim, KH
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机构:Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Kim, KH
Bae, J
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机构:Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Bae, J
Jhe, W
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机构:
Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South KoreaSeoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Jhe, W
[1
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机构:
[1] Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
[2] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
A scanning nanolithography is demonstrated by employing near-field optical microscopy with a pulled micropipette which is used for material transport as well as distance regulation. Delivering the photoresist through the small aperture (300 nm diameter) of the pulled pipette with the shear-force distance control, we have fabricated nanometric dots (300 nm diameter) on the gold-sputtered substrate. This scheme may be also useful in nanometric control of chemical reaction and repair of nanometric structures. (C) 2000 American Institute of Physics. [S0003-6951(00)04542-3].