Simple phase extraction in x-ray differential phase contrast imaging

被引：5
作者：
Liu, Xin [1 ]
Guo, Jin-Chuan [1 ]
Lei, Yao-Hu [1 ]
Li, Ji [1 ]
Niu, Han-Ben [1 ]
机构：
[1] Shenzhen Univ, Coll Optoelect Engn, Key Lab Optoelect Devices & Syst, Minist Educ & Guangdong Prov, Shenzhen 518060, Peoples R China
来源：
CHINESE PHYSICS B | 2016年 / 25卷 / 02期
基金：
中国国家自然科学基金;
关键词：
x-ray imaging; x-ray interferometry; Talbot and self-imaging effects; phase contrast imaging; GRATING INTERFEROMETER;
D O I：
10.1088/1674-1056/25/2/028704
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A fast and simple method to extract phase-contrast images from interferograms is proposed, and its effectiveness is demonstrated through simulation and experiment. For x-ray differential phase contrast imaging, a strong attenuation signal acts as an overwhelming background intensity that obscures the weak phase signal so that no obvious phase-gradient information is detectable in the raw image. By subtracting one interferogram from another, chosen at particular intervals, the phase signal can be isolated and magnified.
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收藏
页数：5
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