All-solid-state reflectance-type electrochromic devices using iridium tin oxide film as counter electrode

被引：35

作者：

Niwa, Tatsuo ^{[1
]}

Takai, Osamu ^{[1
]}

机构：

[1] Nagoya Univ, Grad Sch Engn, Dept Mat Phys & Energy Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 18期

关键词：

Electrochromic device; Tungsten oxide; Thin film; Iridium oxide; Solid electrolyte; Tantalum oxide; Tin oxide; TANTALUM OXIDE;

D O I：

10.1016/j.tsf.2010.04.030

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We prepared an all-solid-state reflectance-type electrochromic device (ECD), consisting of the following five layers: Al/WO3/Ta2O5/IrxSn1-xO2/ITO. Using RF ion plating, we prepared a film containing dispersed iridium oxide in a tin oxide matrix; this film acts as the counter electrode in the all-solid-state ECD. Protons were used as coloration ions in the ECD. The size of the ECD was 150 cm(2), and the reflectance changed between more than 60% from 15%. The coloration and bleaching response times were less than a few seconds. We analyze the optical characteristics of the ECD, and report the results of a consecutive drive test and a high-temperature heat resistance test. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：5340 / 5344

页数：5

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