Impact of pre-fabrication treatments on n-type UMG wafers for 21% efficient silicon heterojunction solar cells

被引:13
|
作者
Basnet, Rabin [1 ]
Weigand, William [2 ]
Yu, Zhengshan J. [2 ]
Sun, Chang [1 ]
Phang, Sieu P. [1 ]
Sio, Hang C. [1 ]
Rougieux, Fiacre E. [3 ]
Holman, Zachary C. [2 ]
Macdonald, Daniel [1 ]
机构
[1] Australian Natl Univ, Res Sch Elect Energy & Mat Engn, Canberra, ACT 2601, Australia
[2] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ USA
[3] Univ New South Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW, Australia
基金
美国国家科学基金会;
关键词
Tabula rasa; Hydrogenation; Phosphorus diffusion gettering; Silicon heterojunction solar cells; Solar-grade silicon; Czochralski silicon; MINORITY-CARRIER LIFETIMES; CRYSTALLINE SILICON; PASSIVATION; PHOSPHORUS; MOBILITY;
D O I
10.1016/j.solmat.2019.110287
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Silicon heterojunction solar cells achieve high conversion efficiency due to the excellent surface passivation provided by the hydrogenated intrinsic amorphous silicon films. However, they require a high-quality wafer as a starting material because their low-temperature processing does not allow for gettering. Czochralski-grown upgraded metallurgical-grade (UMG-Cz) silicon is a low-cost alternative to electronic-grade silicon for silicon solar cells, but is often limited in lifetime by grown-in defects. We have previously shown that pre-fabrication treatments, namely tabula rasa, phosphorus diffusion gettering, and hydrogenation, can significantly improve the bulk quality of UMG-Cz wafers. These help to mitigate the impact of grown-in oxygen precipitate nuclei and metallic impurities. In this work, we fabricate rear-junction silicon heterojunction solar cells on both as-grown and pre-treated UMG-Cz and electronic-grade wafers. We show that pre-fabrication treatments have a marked impact on solar cell efficiencies. With pre-fabrication treatment, the efficiency improves from 18.0% to 21.2% for the UMG-Cz cells and 21.2%-22.7% for the electronic-grade cells. Comparison of the open-circuit voltages of the as-grown and pre-treated UMG-Cz and electronic-grade cells using Quokka simulations reveals that the bulk lifetime remains the primary limiting factor for the UMG-Cz wafers.
引用
收藏
页数:7
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