Imaging near-field transverse modes of vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

被引：0
|
作者：
Lu, NH
Chen, CY
Lin, CS
Liu, WC
Tsai, DP
机构：
[1] De Lin Inst Technol, Dept Elect Engn, Taipei 23646, Taiwan
[2] Natl Taiwan Normal Univ, Dept Phys, Taipei 117, Taiwan
[3] Natl Taiwan Ocean Univ, Inst Optoelect Sci, Chilung, Taiwan
[4] Natl Taiwan Univ, Dept Phys, Taipei 10764, Taiwan
[5] Natl Taiwan Univ, Ctr Nanostorage Res, Taipei 10764, Taiwan
来源：
SCANNING | 2004年 / 26卷 / 05期
关键词：
near field; short tip; tapping mode; transverse mode; vertical-cavity surface-emitting laser;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We have characterized the oxide-confined vertical-cavity surface-emitting laser (VCSEL) using short-tip, tapping-mode tuning fork near-field scanning optical microscopy (TMTF-NSOM). The near-field radiation patterns of the VCSEL were measured. By comparing the topographic and optical images, we attribute the asymmetric transverse modes to the geometric defect outside the oxide aperture. We also performed spatially resolved spectroscopic imaging over the surface of the VCSEL by coupling NSOM to a spectrometer.
引用
收藏
页码：I43 / I46
页数：4
相关论文
共 50 条
  • [1] Near-field scanning optical microscopy of cleaved vertical-cavity surface-emitting lasers
    DeAro, JA
    Weston, KD
    Herrick, RW
    Petroff, PM
    Buratto, SK
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (12) : 1364 - 1367
  • [2] Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy
    Knopp, KJ
    Christensen, DH
    Vander Rhodes, G
    Pomeroy, JM
    Goldberg, BB
    Ünlü, MS
    TESTING, PACKAGING, RELIABILITY, AND APPLICATIONS OF SEMICONDUCTOR LASERS IV, 1999, 3626 : 208 - 216
  • [3] Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy
    Vander Rhodes, GH
    Pomeroy, JM
    Unlu, MS
    Goldberg, BB
    Knopp, KJ
    Christensen, DH
    APPLIED PHYSICS LETTERS, 1998, 72 (15) : 1811 - 1813
  • [4] Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy
    Boston Univ Photonics Cent, Boston, United States
    Appl Phys Lett, 15 (1811-1813):
  • [5] Spatially resolved derivative spectroscopy of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy
    Bradford, WC
    Beach, JD
    Collins, RT
    Kisker, DW
    Galt, D
    APPLIED PHYSICS LETTERS, 2002, 80 (06) : 929 - 931
  • [6] Imaging concentric modulations in transverse modes of a vertical-cavity surface emitting laser using a scanning near-field optical microscope
    Holton, M. D.
    Rees, P.
    Dunstan, P. R.
    JOURNAL OF APPLIED PHYSICS, 2007, 101 (02)
  • [7] Theoretical analysis and characterization of injection current distribution and influences on optical near-field modes in gain-guided vertical-cavity surface-emitting lasers
    Cai Lu-Gang
    Wu Jian
    ACTA PHYSICA SINICA, 2008, 57 (06) : 3531 - 3537
  • [8] Dual mode near-field scanning optical microscopy for near-field imaging of surface plasmon polariton
    Kihm, H. W.
    Lee, K. G.
    Kim, D. S.
    Ahn, K. J.
    OPTICS COMMUNICATIONS, 2009, 282 (12) : 2442 - 2445
  • [9] Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers
    Kim, J.
    Boyd, J.T.
    Jackson, Howard E.
    Choquette, K.D.
    2000, American Inst of Physics, Woodbury, NY, USA (76)
  • [10] Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers
    Kim, J
    Boyd, JT
    Jackson, HE
    Choquette, KD
    APPLIED PHYSICS LETTERS, 2000, 76 (05) : 526 - 528
12345