Optimized Mueller polarimeter with liquid crystals

被引:230
作者
De Martino, A [1 ]
Kim, YK [1 ]
Garcia-Caurel, E [1 ]
Laude, B [1 ]
Drévillon, B [1 ]
机构
[1] Ecole Polytech, UMR 7647, CNRS, Phys Interfaces & Couches Minces Lab, F-91128 Palaiseau, France
关键词
D O I
10.1364/OL.28.000616
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrate a Mueller polarimeter in which the polarization-state generator and analyzer are both composed of a linear polarizer and two liquid-crystal variable retarders. The polarimeter is designed to optimize the accuracy of the final results by minimization of the condition numbers of the modulation and analysis matrices. The polarimeter calibration, a difficult task by conventional procedures, is achieved easily by,use of the eigenvalue method of Compain et al. [Appl. Opt. 38, 3490 (1999)]. The overall polarimeter performance is tested with a linear polarizer at various angles and a compensator at various retardations. (C) 2003 Optical Society of America.
引用
收藏
页码:616 / 618
页数:3
相关论文
共 15 条
[1]  
AZZAM RM, 1977, OPT LETT, V2, P148
[2]   Polarization errors associated with zero-order achromatic quarter-wave plates in the whole visible spectral range [J].
Boulbry, B ;
Bousquet, B ;
Le Jeune, B ;
Guern, Y ;
Lotrian, J .
OPTICS EXPRESS, 2001, 9 (05) :225-235
[3]   Double-pass imaging polarimetry in the human eye [J].
Bueno, JM ;
Artal, P .
OPTICS LETTERS, 1999, 24 (01) :64-66
[4]   Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films [J].
Collins, RW ;
Koh, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1999, 16 (08) :1997-2006
[5]   General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers [J].
Compain, E ;
Poirier, S ;
Drevillon, B .
APPLIED OPTICS, 1999, 38 (16) :3490-3502
[6]   High-frequency modulation of the four states of polarization of light with a single phase modulator [J].
Compain, E ;
Drevillon, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (04) :1574-1580
[7]   Automated high-speed Mueller matrix scatterometer [J].
Delplancke, F .
APPLIED OPTICS, 1997, 36 (22) :5388-5395
[8]   MUELLER MATRIX DUAL-ROTATING RETARDER POLARIMETER [J].
GOLDSTEIN, DH .
APPLIED OPTICS, 1992, 31 (31) :6676-6683
[9]  
JASPERSON SN, 1969, REV SCI INSTRUM, V40, P7611
[10]   Two-modulator generalized ellipsometry: experiment and calibration [J].
Jellison, GE ;
Modine, FA .
APPLIED OPTICS, 1997, 36 (31) :8184-8189