共 50 条
- [1] SMILETRAP -: A Penning trap facility for precision mass measurements using highly charged ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 487 (03): : 618 - 651
- [2] Precision mass measurements using highly charged ions from an electron beam ion source ELECTRON BEAM ION SOURCES AND TRAPS AND THEIR APPLICATIONS, 2001, 572 : 238 - 257
- [3] High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP HCI 2006: 13TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS, 2007, 58 : 109 - +
- [5] Precision mass measurements using a penning trap and highly charged ions produced in an electron beam ion source PHYSICA SCRIPTA, 1997, T71 : 88 - 95
- [7] Precision mass spectrometry of highly charged ions with TITANStatus and outlook Hyperfine Interactions, 2014, 227 : 239 - 246
- [8] SMILETRAP - Atomic mass measurements with ppb accuracy by using highly charged ions HYPERFINE INTERACTIONS, 1996, 99 (1-3): : 83 - 89